期刊
THIN SOLID FILMS
卷 366, 期 1-2, 页码 8-10出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(00)00862-2
关键词
laser ablation; titanium oxide; brookite films; Raman scattering
Pulsed laser deposition has been used to prepare thin films of TiO2 on silicon and other substrates. X-ray diffraction and Raman scattering results show that brookite is the main phase present in the films. Brookite has not previously been reported for pulsed laser deposited titania thin films. (C) 2000 Published by Elsevier Science S.A. All rights reserved.
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