期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
卷 39, 期 5B, 页码 L445-L448出版社
INST PURE APPLIED PHYSICS
DOI: 10.1143/JJAP.39.L445
关键词
gallium nitride; aluminum gallium nitride; ultraviolet; light-emitting diode; double heterostructure; sapphire
Room-temperature deep-ultraviolet emission has been observed from Al0.13Ga0.87N/Al0.10Ga0.90N double heterostructure tight-emitting diodes (LEDs) on (0001)-oriented sapphire substrate. By introducing undoped barrier layers, which sandwich the active layer, the LED was operated at a peak emission wavelength of 339 nm with a narrow linewidth of 5.6 nm. The dependence of emission intensity on injection current suggests that the nonradiative recombination was suppressed and the diffusion current for the recombination process was dominant at the injection current of over 20 mA.
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