4.4 Article Proceedings Paper

Dry etch improvements in the SOI Wafer Flow Process for IPL stencil mask fabrication

期刊

MICROELECTRONIC ENGINEERING
卷 53, 期 1-4, 页码 609-612

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/S0167-9317(00)00388-9

关键词

-

向作者/读者索取更多资源

The 4x Ion Projection Lithography (IPL), which is designed to reach sub 100nm resolution on the wafer plane, uses stencil membrane masks out of 150mm SOI (Silicon On Insulator) wafers [1]. The structured circular membranes have a diameter of 126mm and a thickness of 3 mu m. Results of a new sub-quarter micron trench etch and membrane dry etch process are presented and discussed.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据