期刊
SYNTHETIC METALS
卷 111, 期 -, 页码 331-333出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/S0379-6779(99)00358-6
关键词
mobility; time-of-flight; carrier transport
We have measured drift mobilities in vacuum deposited films of tris(8-quinolinolato)aluminum (Alq(3)), a triphenylamine derivative (TPD) and a naphtyl-substituted benzidine derivative (alpha-NPD) using a time-of-flight (TOF) technique. The hole mobilities of TPD and alpha-NPD are about two orders of magnitude higher than the electron mobility of Alq(3). This implies that the current density versus applied voltage characteristics is dominated by the electron mobility of Alq(3) rather than the hole mobility of TPD or alpha-NPD in double-layered devices ITO/TPD or alpha-NPD (50 nm)/Alq(3) (50 nm)/MgAg. (C) 2000 Elsevier Science S.A. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据