期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 33, 期 2, 页码 977-979出版社
MUNKSGAARD INT PUBL LTD
DOI: 10.1107/S0021889800003617
关键词
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A procedure is described for estimating the background outline in powder diffraction patterns. It essentially consists of an extension of traditional smoothing procedures to include Bragg peaks in addition to profile random fluctuations. This approach is particularly suited for dealing with diffraction patterns obtained from semicrystalline polymer samples; some applications to this kind of experimental data are presented.
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