期刊
APPLIED PHYSICS LETTERS
卷 76, 期 26, 页码 3944-3946出版社
AMER INST PHYSICS
DOI: 10.1063/1.126829
关键词
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To explain various temperature-dependent resistivity measurements [R(T)] on bismuth (Bi) nanowires as a function of wire diameter down to 7 nm, a semiclassical transport model is developed, which explicitly considers anisotropic and nonparabolic carriers in cylindrical wires, and the relative importance of various scattering processes. R(T) of 40 nm Bi nanowires with various Te dopant concentrations is measured and interpreted within this theoretical framework. (C) 2000 American Institute of Physics. [S0003-6951(00)03026-6].
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