期刊
PHYSICAL REVIEW LETTERS
卷 85, 期 1, 页码 190-193出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.85.190
关键词
-
The relations between electrical and mechanical properties of constrained ferroelectric films are analyzed. It is shown that the internal stresses and the elastic constants can be determined through the measurement of the electrical response. The change in the polarization is proportional to internal stresses due to film-substrate misfit, whereas the linear electrical and electromechanical responses to external field do not depend on the misfit and are determined by the film constraint. The theoretical results are successfully applied to PbZr0.2Ti0.8O3 firms on (001) LaAlO3 substrate which exhibit a considerable increase in the saturation polarization due to epitaxial stresses. Significant recovery in the piezoelectric constant and susceptibility is theoretically predicted and experimentally verified for specific film configurations which reduce the degree of constraint. The concept presented in this Letter can be expanded to constrained ferromagnetic and superconductor films.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据