期刊
PHYSICAL REVIEW B
卷 62, 期 3, 页码 2074-2084出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.62.2074
关键词
-
Atomically resolved dynamic force microscopy (DFM) images of step and kink sites of NaCl films grown on the Cu(111) surface are presented. Combining experimental results with an atomistic modeling of DFM imaging, we study the mechanism of contrast formation and extract more information about the tip and NaCl film structure. The experimental results and theoretical modeling systematically demonstrate the enhanced interaction of step and kink sites of one kind with the tip. This is explained by the enhanced gradient of the electrostatic potential at low-coordinated surface sites, and considerable displacements of the step edge and kink atoms from their sites due to the interaction with the tip upon approach. The theoretical analysis predicts that the silicon tip is effectively an insulator, and that the NaCl island cannot be thicker than two monolayers. We discuss the shape and chemical structure of the tip and the mechanism of damping during DFM imaging.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据