4.4 Letter

Growth of copper and palladium on α-Al2O3(0001)

期刊

SURFACE SCIENCE
卷 460, 期 1-3, 页码 L510-L514

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(00)00594-X

关键词

aluminium oxide; atomic force microscopy; copper; growth; low index single crystal surface; palladium

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Non-contact atomic force microscopy (NC-AFM) has been used to image the room-temperature growth of copper and palladium on the (1 x 1) and (root 31 x root 31) R +/- 9 degrees terminations of alpha-Al2O3(0001). Three-dimensional (3D) clusters of palladium are observed on both the (1 x 1) and the (root 31 x root 31) R +/- 9 degrees terminations, with 3D clusters of copper observed on the reconstructed surface. There is evidence of step-edge-dominated growth of palladium on the (root 31 x root 31) R +/- 9 degrees termination. (C) 2000 Elsevier Science B.V. All rights reserved.

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