期刊
MICRON
卷 31, 期 4, 页码 355-362出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0968-4328(99)00114-6
关键词
electron energy-loss spectroscopy; transmission electron microscope; transition metal oxides
类别
The properties of transition metal oxides are related to the presence Of elements with mixed valences. The spectroscopy analysis of the valence,states is feasible experimentally, but a spatial mapping of valence states of transition metal elements is a challenge to existing microscopy techniques. In this paper. with the use of valence state information; provided by the white lines and near-edge fine structures observed using the electron energy-loss spectroscopy (EELS) in a transmission electron microscope (TEM), a novel experimental approach is demonstrated to map the valence state distributions of Mn and Co using the ratio of white lines in the energy-filtered TEM. The valence state map is almost independent of specimen thickness in the thickness range adequate for quantitative EELS microanalysis. An optimum spatial resolution of similar to 2 nm has been achieved for a two-phase Co oxides. (C) 2000 Elsevier Science Ltd. All rights reserved.
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