期刊
PHYSICAL REVIEW LETTERS
卷 85, 期 9, 页码 1998-2001出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.85.1998
关键词
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The microwave dielectric response of a ferroelectric thin film is measured locally using time-resolved confocal scanning optical microscopy. Measurements performed on an ensemble of nanometer-scale regions show a well-defined phase shift between the paraelectric and ferroelectric response at 2-4 GHz. Application of a static electric field produces large local variations in the phase of the ferroelectric response. These variations are attributed to the growth of in-plane ferroelectric nanodomains whose size-dependent relaxation frequencies lead to strong dielectric dispersion at mesoscopic scales.
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