期刊
THIN SOLID FILMS
卷 373, 期 1-2, 页码 189-194出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/S0040-6090(00)01132-9
关键词
magnetron sputtering; indium tin oxide; Zn co-doped ITO; thin films; etching rate; transparent conducting oxide
Zn-co-doped indium-tin-oxide (ITO) films have been prepared by de magnetron sputtering using powder targets. Zn-co-doped ITO films with a practical etching rate as well as a low resistivity were obtained; in particular, etching rate could be controlled by varying the Zn content doped into ITO. In addition, a resistivity of 2-3 x 10(-4) IZ cm was obtained in Zn-co-doped ITO films prepared with a Sn content of 9.3 at.% and a Zn content of 0-34.1 at.% under optimized target preparation and sputter deposition conditions. The spatial distribution of electrical properties on the substrate surface in Zn-co-doped ITO films was considerably affected by the Zn content. A relatively uniform distribution of electrical properties was obtained in films prepared with a Zn content in the range of 15-34.1 at.%. (C) 2000 Elsevier Science S.A. All rights reserved.
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