期刊
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ELSEVIER SCIENCE SA
DOI: 10.1016/S0921-5093(00)00846-7
关键词
strain; SrTiO3; multilayers; x-ray; grazing incidence diffraction; high-temperature superconducting (HTS) layers
A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples omega- and phi-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers. (C) 2000 Elsevier Science S.A. All rights reserved.
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