期刊
PHYSICAL REVIEW LETTERS
卷 85, 期 13, 页码 2745-2748出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.85.2745
关键词
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We propose a simple interferometric technique for hard x-ray spatial coherence characterization, recording a Fresnel interference pattern produced by a round fiber or a slit. We have derived analytical formulas that give a direct relation between a visibility of interference fringes and either the source size or the transverse coherence length. The technique is well suited to third-generation synchrotron radiation sources and was experimentally applied to determine the spatial coherence length and the source size at the European Synchrotron Radiation Facility.
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