期刊
TALANTA
卷 53, 期 1, 页码 9-16出版社
ELSEVIER
DOI: 10.1016/S0039-9140(00)00375-1
关键词
infrared ellipsometry; surface enhanced infrared absorption; optical constants
Infrared ellipsometry has been applied to determine the refractive index n and the absorption index k as well as the thickness of metal island films causing surface enhanced infrared absorption (SEIRA). The results from numerous films prepared in several campaigns are presented. For films of a nominal thickness of 6 nm, k is found to range from 0 to 3, while n ranges from 5 to 8. Among these two optical constants a close correlation is observed. Layers suitable for SEIRA exhibit an unusual spectral feature whose origin is explained. (C) 2000 Elsevier Science B.V. All rights reserved.
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