Chemical sensing materials characterization by Kelvin probe technique

This paper deals first of all with an improvement of the Kelvin probe (KP) theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Langmuir-Blodgett (LB) films of porphyrins of different thickness. The output intensities of the work function have been investigated and comments are given of the results obtained. The link between the work function and thickness of material under test has been analyzed and discussed as a method for the coverage factor estimation of absorbing surfaces. (C) 2000 Elsevier Science B.V. All rights reserved.