期刊
JOURNAL OF MICROSCOPY
卷 200, 期 -, 页码 105-108出版社
WILEY
DOI: 10.1046/j.1365-2818.2000.00770.x
关键词
adaptive aberration correction; confocal microscopy; two-photon microscopy
类别
We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferroelectric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (x-z) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 mum in an aqueous specimen.
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