期刊
JOURNAL OF CRYSTAL GROWTH
卷 220, 期 4, 页码 560-571出版社
ELSEVIER
DOI: 10.1016/S0022-0248(00)00843-5
关键词
CVD; SiC; model
A computational model for chemical vapor deposition (CVD) of silicon carbide (SiC) in a hot-wall reactor is developed, where the susceptor is tapered with a rectangular cross-section. The present work focuses on the advection-diffusion-reaction process in the susceptor. The precursors are propane and silane, and the carrier gas is hydrogen with mass fraction higher than 99%. Computed growth rates under different system pressures and precursor concentrations are compared to the experimental data measured on samples grown in the Linkoping CVD reactor. The gas composition distribution in the susceptor and the growth rate profile on the susceptor floor are shown and analyzed. Dependence of the growth rate on precursor concentrations is investigated. It is demonstrated that the growth rate of SiC may either be carbon transport limited or silicon controlled, depending on the input carbon-to-silicon ratio. (C) 2000 Elsevier Science B.V. All rights reserved.
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