Plug n play scanning probe microscopy

A new concept of scanning probe microscopy allows the investigation of arbitrarily positioned and oriented, possibly curved locations situated at large and immobile objects, which cannot be isolated from the environment. The concept is based on the beetle type scanning probe microscope and uses, as a key element, magnetic forces which increase the pressure at the contacts of microscope and object. The magnetic forces are shown to greatly decrease the sensitivity of the microscope to vibrations and acoustic noise from the environment. Sufficiently large magnetic forces make the microscope operation independent from orientation and thereby relieve a decisive constraint for imaging application. The capabilities of the new concept are exemplified for a plug n play scanning tunneling microscope. (C) 2000 American Institute of Physics. [S0034-6748(00)03712-6].