X-ray photoelectron spectroscopic measurements on glassy Ge20S80-xBx (x=0,16)

X-ray photoelectron spectroscopy measurements have been performed on n-type Bi-modified Ge20S64Bi16 glass. The observed chemical shifts show that Bi is incorporated as a positive charged center into the matrix of Ge20S80 parent glass. (C) 2000 Elsevier Science B.V. An rights reserved.