期刊
APPLIED PHYSICS LETTERS
卷 77, 期 23, 页码 3695-3697出版社
AMER INST PHYSICS
DOI: 10.1063/1.1330571
关键词
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High-resolution near-field optical imaging with microfabricated probes is demonstrated. The probes are made from solid quartz tips fabricated at the end of silicon cantilevers and covered with a 60-nm-thick aluminum film. Transmission electron micrographs indicate a continuous aluminum layer at the tip apex. A specially designed instrument combines the advantages of near-field optical and beam-deflection force microscopy. Near-field optical data of latex bead projection patterns in transmission and of single fluorophores have been obtained in constant-height imaging mode. An artifact-free optical resolution of 31.7 +/-3.6 nm has been deduced from full width at half maximum values of single molecule images. (C) 2000 American Institute of Physics. [S0003-6951(00)05449-8].
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