期刊
SURFACE SCIENCE
卷 472, 期 1-2, 页码 125-132出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0039-6028(00)00928-6
关键词
electron-solid diffraction; photoelectron diffraction; surface structure, morphology, roughness and topography; boron nitride; nickel
A new substrate emission X-ray photoelectron diffraction method that subtracts a clean substrate measurement from a measurement of the adsorbate-covered sample is able to reveal important adsorbate-substrate registry information while it suppresses disturbing substrate effects in the diffractograms. Short measurement times and an unambiguous data quality allow for a quick and convincing structural characterization of homogeneous adsorbate layers. The data processing and analysis methods are illustrated with experimental h-BN/Ni(1 1 1) data and multiple-scattering calculations. (C) 2001 Elsevier Science B.V. All rights reserved.
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