4.7 Article Proceedings Paper

A plasma immersion implantation system for materials modification

期刊

SURFACE & COATINGS TECHNOLOGY
卷 136, 期 1-3, 页码 138-141

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/S0257-8972(00)01043-4

关键词

plasma immersion ion implantation; hydrogen plasma; layer transfer; silicon-on-insulator wafers; protonic mode

向作者/读者索取更多资源

A plasma immersion ion implantation (PIII) system is described which provides the capability to bridge the range between research exploration and commercial applications for materials modification of electronic materials, with a particular focus on layer transfer processes. The Silicon Genesis PIII system is capable of operation at high plasma densities (approximate to 5 x 10(11) ions/cm(3) at the wafer) with high purity, mono-species ionization (> 99% H+ ions with a hydrogen plasma). The first generation of Silicon Genesis PIII systems is equipped to use 200-mm wafers (through an automated loadlock) and pulsed potentials up to 50 kV, Use of the mono-species ionization characteristic of the Silicon Genesis PIII system provides the capability to precisely vary the characteristics of surface layers through implantation of atoms and damage creation at well-controlled depths in the materials of choice. The Silicon Genesis PIII system is designed for efficient production of SOI and other layer transfer-generated materials and can be adapted for materials modification of more complex structures and work pieces. (C) 2001 Elsevier Science B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据