期刊
PHYSICAL REVIEW LETTERS
卷 86, 期 6, 页码 1102-1105出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.86.1102
关键词
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Measurements are reported on the magnetization reversal in submicron magnetic rings fabricated by high-resolution electron beam lithography and lift-off from cobalt thin films. For all dimensions investigated, with diameters of 300-800 nm and a thickness of 10-50 nm, the flux closure state is the stable magnetization configuration. However, with increasing diameter and decreasing film thickness a metastable near single domain state can be obtained during the reversal process in an in-plane applied field.
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