期刊
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
卷 11, 期 1, 页码 2730-2733出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/77.919627
关键词
coated conductors; critical currents; grain boundaries; modelling
The crystallographic alignment of various layers of high Te coated conductors has been studied in detail using X-Ray Diffraction (XRD) and Electron BackScatter Diffraction (EBSD), Several possible configurations of buffer layers on NiFe substrates are considered, including metallic buffers (Pd/Ag) and native oxides (NiFe2O4) as well as the more widely studied ceramic buffer route(CeO2/YSZ), The surface texture data (EBSD) was compared with bulk texture measurements (XRD) in order to assess the relationship between them. The percolative properties of the grain structure were investigated using two dimensional hexagonal grain model, which considers both in-plane and out-of-plane grain boundary misorientations. The model was extended to consider critical currents of macroscopic samples. Factors which affect the percolative nature of current now in superconducting coated conductors, such as grain size and tape dimensions, have also been studied.
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