期刊
APPLIED PHYSICS LETTERS
卷 78, 期 19, 页码 2928-2930出版社
AMER INST PHYSICS
DOI: 10.1063/1.1371529
关键词
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We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: similar to 10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of similar to1 nm. Using this system, we have measured the current-voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. (C) 2001 American Institute of Physics.
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