期刊
PHYSICAL REVIEW LETTERS
卷 86, 期 19, 页码 4334-4337出版社
AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.86.4334
关键词
-
We present simultaneous imaging of TiO2(110)-(1 x I) and -(1 x 2) using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback. while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in (1 X 1) and in phase in (1 x 2). The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in (1 x 2), but reduced in (1 x 1).
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据