Electron spectrometry at the μeV level and the electron affinities of Si and F

Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of Si-28 and F-19 are 11207.252(18) and 27432.446(19) cm(-1), i.e. 1.3895220(24) and 3.401 1895(25) eV, respectively.