4.6 Article

Fundamentals and model of photonic-force microscopy

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OPTICS LETTERS
卷 26, 期 10, 页码 707-709

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OPTICAL SOC AMER
DOI: 10.1364/OL.26.000707

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Exact calculations of the near-field electromagnetic force on a nanoparticle exerted by the presence of a corrugated dielectric interface are carried out. The illumination of this system excites the particle eigenmodes. The calculation is two-dimensional, so the nanoparticle is actually a nanocylinder that scans parallel to the interface. This system constitutes a model of force transduction and surface topography imaging for a photonic-force microscope with signal enhancement owing to morphological resonance excitation of the probe. (C) 2001 Optical Society of America.

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