期刊
SCRIPTA MATERIALIA
卷 44, 期 8-9, 页码 1175-1179出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S1359-6462(01)00684-4
关键词
ferroelectricity; piezoelectricity; atomic force microscopy (AFM), self-assembly; nanostructures
A top-down approach using a-beam lithography and a bottom-up one using self-assembly methods were used to fabricate ferroelelectric Pb(Zr,Ti)O-3, SrBi2Ta2O9 and BaTiO3 nanostructures with lateral sizes in the range of 30 nm to 100 nm. Switching of single sub-100 nm cells was achieved and piezoelectric hysteresis loops were recorded using a scanning force microscope working in piezoresponse mode. The piezoelectricity and its hysteresis acquired for 100 nm PZT cells demonstrate that a further decrease in lateral size under 100 nm appears to be possible and that the size effects are not fundamentally limiting on increase density of non-volatile ferroelectric memories in the Gbit range. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
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