A new method for determining small misorientations from electron back scatter diffraction patterns

SCRIPTA MATERIALIA

卷 44, 期 10, 页码 2379-2385

PERGAMON-ELSEVIER SCIENCE LTD

EBSD; SEM; misorientation; electron microscopy; dislocation cells

Nanoscience & Nanotechnology Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering