期刊
PHYSICS LETTERS A
卷 284, 期 4-5, 页码 162-171出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0375-9601(01)00311-5
关键词
quality factor; nodal support; silicon; sapphire; thermal noise; gravitational waves
We measured the mechanical loss of crystalline anisotropic samples (silicon and sapphire) using a nodal support. The measured quality factor of the silicon sample reached 1.0 x 10(8) at room temperature. The sapphire sample showed lower quality factors, 6.4 x 10(7) at most, which were analytically confirmed to be dominated by surface loss. (C) 2001 Elsevier Science B.V. All rights reserved.
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