4.4 Article Proceedings Paper

Electron accumulation layer on clean In-terminated InAs(001)(4 x 2)-c(8 x 2) surface

期刊

SURFACE SCIENCE
卷 482, 期 -, 页码 587-592

出版社

ELSEVIER
DOI: 10.1016/S0039-6028(01)00927-X

关键词

indium arsenide; low energy electron diffraction (LEED); scanning tunneling microscopy; electron emission

向作者/读者索取更多资源

We have investigated clean In-terminated InAs(001)(4 x 2)-c(8 x 2) surface by LEED, STM and high-resolution core-level and valence band (VB) spectroscopies. The In4d and As3d core levels showed the presence of chemically shifted components. The decomposition of In4d core level exhibited a new surface component located close to that of free indium, metal. This indicates that the origin of the electron emission at the Fermi level measured in the VB spectra is probably due to the free In charge, STM measurements showed a uniform distribution of charge on the In-rows. which are highly ordered over large areas of the surface. (C) 2001 Elsevier Science B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据