期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/S0168-9002(01)00630-1
关键词
high-energy X-ray; X-ray diffraction
A horizontal two-axis diffractometer for glasses and liquids, installed at SPring-8 bending magnet beamline BL04B2, operated at 8 GeV electron energy, is described. Photon energies of 37.8 and 61.7 keV were obtained using a bent Si (1 1 1) crystal and a bent Si (2 2 0) crystal, respectively. The instrument has been successfully applied to measure diffraction spectra of vitreous SiO2 in transmission geometry up to scattering vector Q = 36 Angstrom (-1), and measured total structure factor S(Q) was well reproduced by reverse Monte Carlo modelling. (C) 2001 Elsevier Science B.V. All rights reserved.
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