期刊
APPLIED PHYSICS LETTERS
卷 79, 期 7, 页码 1036-1038出版社
AMER INST PHYSICS
DOI: 10.1063/1.1392982
关键词
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The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT-substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported. (C) 2001 American Institute of Physics.
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