Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy

The electronic structure of a ferroelectric Bi4Ti3O12 (BIT) thin film was investigated by soft-X-ray emission spectroscopy (SXES). In the valence band energy region, Ti 3d and O 2p partial density of states were observed in O Is and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the 0 2p state. This finding indicates that the 0 2p state strongly hybridizes with the Ti 3d state in the valence band.