期刊
ELECTRONICS LETTERS
卷 37, 期 20, 页码 1243-1244出版社
IEE-INST ELEC ENG
DOI: 10.1049/el:20010863
关键词
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The quality of imaging subwavelength features with the aid of multilayers containing negative permittivity materials is examined. Examples for nearly perfect imaging are given and limitations discussed. Spatial compression (image narrower than object) is shown to be possible and a qualitative physical picture based on the Poynting vector is presented.
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