Characterization of the transverse coherence of hard synchrotron radiation by intensity interferometry

The transverse coherence of x rays was-measured with an intensity interferometer using a 120-mu eV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as wen as the coherence degradation by a phase object in the beam path, were quantitatively characterized.