期刊
JOURNAL OF CHEMICAL PHYSICS
卷 115, 期 14, 页码 6722-6727出版社
AMER INST PHYSICS
DOI: 10.1063/1.1398576
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Specular x-ray reflectivity has been used to probe the microstructures of siloxane-based self-assembled electro-optic superlattices composed of high-hyperpolarizable organic chromophore arrays intercalated with Ga and In oxide sheets. The film thickness increases linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of the synthetic approach. Relatively dense metal oxide structures are detected in these systems. The x-ray reflectivity data also indicate that the dependence of the relative surface roughness on the number of layers is nearly identical for self-assembled organic and organic-inorganic hybrid film structures. (C) 2001 American Institute of Physics.
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