Electron correlation effects in resonant inelastic x-ray scattering of NaV2O5 -: art. no. 077401

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5, In contrast to single photon techniques, RIXS at the vanadium L-3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at - 1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U = 3.0 +/- 0.2 eV.