Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

The structural and electrical properties of metalorganic chemical vapor deposition-grown Pb(Zr0.35Ti0.65)O-3 thin films ranging in thickness from 700 to 4000 Angstrom have been investigated. Cross-sectional scanning electron microscopy showed that these films are columnar, with grains extending through the thickness of the film. High-resolution x-ray diffraction showed that while the thickest films are tetragonal, with reflections corresponding to a-type and c-type domains, films thinner than 1500 Angstrom are not. Electron backscatter diffraction and hysteresis loop measurements showed that the thinnest films are ferroelectric and have a rhombohedral crystal structure. (C) 2002 American Institute of Physics.