期刊
APPLIED PHYSICS LETTERS
卷 80, 期 12, 页码 2132-2134出版社
AMER INST PHYSICS
DOI: 10.1063/1.1463700
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Silver Schottky contacts were fabricated on (11 (2) over bar0) n-ZnO epilayers, which were grown on R-plane sapphire substrates by metalorganic chemical-vapor deposition. The flatband barrier height was determined to be 0.89 and 0.92 eV by current-voltage and capacitance-voltage measurements, respectively. The ideality factor was found to be 1.33. (C) 2002 American Institute of Physics.
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