期刊
ACTA MATERIALIA
卷 50, 期 7, 页码 1771-1779出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S1359-6454(02)00028-9
关键词
stress-strain relationship measurements; X-ray diffraction
First results are presented on the development of the elastic strain tensor in a single embedded grain during tensile loading of a copper sample. The technique is based on the use of focused high-energy X-rays from a synchrotron source. Measurements are performed by the rotation method, and automated indexing routines are used to group reflections belonging to a single grain. In total. 17 reflections were monitored as a function of tensile load. At each load level three elements of the strain tensor were fitted using a singular value decomposition routine for over-determined linear systems. Sources of systematic error are discussed, and a method for extending the technique towards simultaneous measurements of ensembles of grains is outlined. (C) 2002 Published by Elsevier Science Ltd on behalf of Acta Materialia Inc.
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