Structural study of 2D dysprosium germanide and silicide by means of quantitative LEED I-V analysis

Quantitative low energy electron diffraction (LEED) studies have been carried out to determine the structure of the rare-earth germanide Ge(1 1 1)1 x 1-Dy and the rare-earth silicide Si(1 1 1)1 x 1-Dy. The analyses reveal structures similar to that of other rare-earth silicides previously studied in which the dysprosium is located sub-surface below a reverse-buckled silicon/germanium bilayer. The LEED study has clearly demonstrated that the dysprosium atom is located above a substrate T4 site and refines earlier MEIS results. (C) 2002 Elsevier Science B.V. All rights reserved.