期刊
JOURNAL OF COLLOID AND INTERFACE SCIENCE
卷 249, 期 1, 页码 84-90出版社
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1006/jcis.2002.8247
关键词
ellipsometry; radio labeling; protein adsorption; mass; thickness
The aim of the present study was to ellipsometrically determine the thickness and surface mass density in air for up to 110-nm-thick organic layers made of alternatingly deposited layers of HSA and polyclonal anti-HSA on hydrophobic silicon. The ellipsometrically determined thickness was compared to that obtained by AFM and the deposited surface mass density calibrated with I-125-labeled proteins. The results indicate a good agreement in protein layer thickness between AFM and ellipsometry when the protein film refractive index N-film = 1.5 - 0i, although then the calculated surface mass density from the ellipsometry data became grossly overestimated by the Cuypers one-component formula. A good agreement in the surface mass density was obtained when the M/A ratio in this formula was lowered from 4.14 to 2.35. This approach indicates a convenient means of determining the refractive indices and surface mass densities of mesothick organic layers proteins on solid Supports. (C) 2002 Elsevier Science (USA).
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