期刊
APPLIED PHYSICS LETTERS
卷 80, 期 19, 页码 3566-3568出版社
AMER INST PHYSICS
DOI: 10.1063/1.1478782
关键词
-
From frequency-dependent ac susceptibility studies of (Cu,T1)BaSrCa2Cu3Oy superconducting thin films, with and without nanodot-induced artificial pinning centers, we estimated the activation energy of flux jumps. The result was that, in the film with nanodots, the pinning potential is several times higher, leading to a probability of thermally activated flux jumps several orders of magnitude lower than in the film without artificial pinning centers. We suggest that our no cost straightforward method for creating extended defects can be successfully employed for the reduction of thermal noise in superconducting electronic devices. (C) 2002 American Institute of Physics.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据