期刊
CHEMICAL PHYSICS LETTERS
卷 359, 期 1-2, 页码 41-47出版社
ELSEVIER
DOI: 10.1016/S0009-2614(02)00578-X
关键词
-
A thin Al2O3 layer grown on NiAl(110) has been studied by scanning tunneling microscopy at about 4 K. The film exhibited monocrystalline ordering compatible with the (111) face of gamma-alumina with a slightly extended surface unit cell. Although the topographical images change substantially with bias voltage we show that the autocorrelation transform of the images clearly reveals the unit cell of the alumina lattice. By using particular tunneling conditions we have identified almost all oxygen atom positions within the unit cell. The parameters applied lead to a considerable interaction between tip and top atoms of the substrate reflected in the image as local perturbations denoted as scratching. (C) 2002 Elsevier Science B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据