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Measurement of X-ray pulse widths by intensity interferometry

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PHYSICAL REVIEW LETTERS
卷 88, 期 24, 页码 -

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AMERICAN PHYSICAL SOC
DOI: 10.1103/PhysRevLett.88.244801

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The pulse width of hard undulator radiation (32 ps width, energy 14 keV) was determined by intensity interferometry. The method, in combination with various x-ray monochromators, enables measurements to be taken over a wide range of time frames, from ns to fs. The applicable target includes measurements of ultrafast x-ray pulse widths from fourth generation synchrotron light sources.

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