4.6 Article

Low-loss high power RF switching using multifinger AlGaN/GaN MOSHFETs

期刊

IEEE ELECTRON DEVICE LETTERS
卷 23, 期 8, 页码 449-451

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2002.801301

关键词

field-effect transistor (FET); GaN; HEMT; heterostructure field-effect transistor (HFET); MOSHFET; RF; switch; wireless

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We demonstrate a novel RF switch based on a multifinger AlGaN/GaN MOSHFET. Record high saturation current and breakdown voltage, extremely low gate leakage current and low gate capacitance of the III-N MOSHFETs make them excellent active elements for RF switching. Using a single element test circuit with 1-mm wide multifinger MOSHFET we achieved 0.27 dB insertion loss and more than 40 dB isolation. These parameters can be further improved by impedance matching and by using submicron gate devices. The maximum switching power extrapolated from the results for 1A/mm 100 mum wide device exceeds 40 W for a 1-mm wide 2-A/mm MOSHFET.

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