4.6 Article

AlGaN/GaN HEMTs on SiC with fT of over 120-GHz

期刊

IEEE ELECTRON DEVICE LETTERS
卷 23, 期 8, 页码 455-457

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2002.801303

关键词

GaN; high electron mobility transistors (HEMTs); SiC

向作者/读者索取更多资源

AlGaN/GaN high electron mobility transistors (HEMTs) grown on semi-insulating Sic substrates with a 0.12 mum gate length have been fabricated. These 0.12-mum gate-length devices exhibited maximum drain current density as high as 1.23 A/mm and peak extrinsic transconductance of 314 mS/mm. The threshold voltage was -5.2 V. A unity current gain cutoff frequency (f(T)) of 121 GHz and maximum frequency of oscillation (f(max)) of 162 GHz were measured on these devices. These f(T) and f(max) values are the highest ever reported values for GaN-based HEMTs.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据